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Particle Analysers

News

Merck Millipore introduces APC SmartTouch airborne particle counter– 1-May-2013

Reduces cleanroom certification and monitoring costs

Air Monitors adds dust analysis system to portfolio– 9-Apr-2013

Offers information on particle size distribution and number in each size range

New technique for environmental monitoring in cleanrooms– 2-Apr-2013

BioTrak from TSI offers real-time viable particle counting

Online particle counter measures eight particle sizes– 12-Feb-2013

Users can choose digital or analogue interfaces for data transfer

Cherwell to exhibit at Pharmig PCT Contamination Control event – 8-Feb-2013

Improving microbiological quality in pharmaceuticals, cosmetics and toiletries

Compact FMSnode integrates cleanroom sensors – 26-Nov-2012

It has an open software structure and modular design

TSI Bio-Trak particle counter is based on LIF measurement– 12-Nov-2012

Measures non-viable products and is capable of classifying a cleanroom

Hach Lange to focus on accuracy and process optimisation at WWEM 2012– 28-Sep-2012

Will unveil the latest MCERTS approved instruments

New technique for visualising and counting airborne particles– 17-Sep-2012

A presentation on the technology was presented at September’s ICCCS 2012 Zurich event

Air monitoring device for isolators and RABS– 14-Sep-2012

It enables sampling heads for standard Petri dishes to be installed at critical control points

First real-time measure of cleanroom particle deposition– 14-Sep-2012

The APMON, which counts particles that land on a work area, was on show at ICCCS 2012 Zurich

Innovative particle counters for the pharma and sensitive foods industries– 23-Aug-2012

Particle counting is a critical component of cleanroom monitoring programmes and thus a cornerstone of Merck Millipore’s complete range of environmental monitoring solutions

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Articles

Biocontamination control – moves toward a better standard – 28-Mar-2013

A review process of the biocontamination control standard ISO14698 has begun. The standard is chiefly concerned with environmental monitoring, but has not been widely adopted because it is not mentioned in any GMP guidance, not does it offer details on how environmental monitoring should be undertaken. The comprehensive review should raise its profile.

AMC: an emerging class of contamination– 1-Oct-2012

Airborne particles are often regarded as the number one contamination source in cleanrooms and controlled production environments, but some trace gases are undesirable for several industrial requirements and processes and are therefore defined as airborne molecular contamination. This kind of contamination is becoming steadily more important in critical cleanroom manufacturing processes.

Meeting the needs of EUV lithography– 1-Aug-2012

The requirements to reduce airborne molecular contamination (AMC) in semiconductor manufacturing cleanrooms are becoming more stringent as the industry prepares to migrate to extreme ultraviolet (EUV) lithography. The Tiger-i platform of analysers from Tiger Optics eliminate the concerns arising from other analytical techniques. By utilising Tiger’s patented CW-CRDS technique, the instruments provide calibration-free, real-time analysis without the concerns of a radioactive source

Applying ISO methods to counter calibration– 21-Nov-2011

International standards for the monitoring of airborne particles apply to all cleanrooms or clean zones. The international committee, TC209 Working Group 1, has been examining potential revisions to the first two sections of the ISO 14644 document. One key change in the proposed revision is the normative reference to a calibration standard for the instrument to be used for cleanroom classification. Although calibration will probably create some additional cost, there will be noteworthy benefits in both the repeatability and the reproducibility of the measurements obtained

Selecting an airborne-particle counter for your environment– 1-Oct-2010

Understanding which features you need in a particle counter is a difficult task. This article will identify the various features available and help you choose which are relevant to your application

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